Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent
1998-01-05
1999-10-26
Beausoliel, Jr., Robert W.
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
714 33, 714 46, G06F 1100
Patent
active
059745690
ABSTRACT:
Generally, the present invention is a method for identifying whether time-based operations of a computer system operate properly for time intervals over which the computer system operates. Specifically, the present invention is operative to identify the type of failure that occurs. The present invention utilizes test programs and test procedures to determine whether the hardware, BIOS, operating system, and computer language handle time and date calculations correctly. The present invention may identify a time period to be evaluated and divide the time period into a plurality of time intervals. This process accepts a first frequency value that specifies the frequency at which time test modules are to execute the time-based operations of the computer system. A first set of time-based test modules are executed at the frequency specified by the first frequency value in a first time interval. A second frequency value may be specified and the time test modules are executed at the frequency specified by second frequency value. The time test modules may be executed for a second time interval at the frequency specified by the second frequency value.
REFERENCES:
patent: 5881222 (1999-03-01), Berry et al.
IBM, "The Year 2000 and 2-Digit Dates: A Guide for Planning and Implementation, Third Edition", Chapters 5, 7, appendices B & C, May 1996.
Joe Chung et al; "y2k PC test script", Internet Newsgroup Forum: comp.software.year-2000; Messages 1 & 2, Apr. 1997.
Guy Dujardin et al; "Year 2000 testplan", Internet Newsgroup Forum: comp.software.year-2000; Messages 1-6, Dec. 1996.
IEEE P2000.2 "Draft Recommended Practice for Information Technology Year 2000 Test Methods"; pp. 1-111, 1998.
Beausoliel, Jr. Robert W.
Shaw Brian H.
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