System and method for determining the value of a memory element

Details System and method for determining the value of a memory element System and method for determining the value of a memory element

2008-01-29

2008-01-29

Luu, Pho M. (Department: 2824)

Static information storage and retrieval

Systems using particular element

Magnetoresistive

C365S171000, C365S207000

Reexamination Certificate

active

07324370

ABSTRACT:
A method for determining memory element values may include: selecting a column of interest containing a desired memory element, disabling the desired memory element, measuring a first current provided to the column of interest, adjusting measurement circuitry to compensate for skew introduced by undesired memory elements, enabling the desired memory element, and measuring a second current provided to the column of interest.

REFERENCES:
patent: 6678187 (2004-01-01), Sugibayashi et al.
patent: 6856532 (2005-02-01), Baker
patent: 6901005 (2005-05-01), Perner et al.
patent: 7027318 (2006-04-01), Smith et al.
patent: 2002/0018360 (2002-02-01), Hartmann
patent: 2004/0032760 (2004-02-01), Baker

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