Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-07-10
2007-07-10
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C700S096000
Reexamination Certificate
active
11345004
ABSTRACT:
A method for identifying an area of a chip to be probed proceeds as follows. A callout list of failures is obtained from a tester, the list including cell name and pin for each failure. A Def file is interrogated to locate a Def entry matching the cell name, and a cell type, cell location, and cell orientation data is obtained for the cell from the Def file. A Lef file is then interrogated to locate a Lef entry matching the cell type, and the coordinates of the pin are obtaining from the Lef file. A GDS file is interrogated to locate a GDS entry matching the cell type, and the coordinates of polygons listed in the GDS entry are obtained. The coordinates of the pin are then crossed with the coordinates of the polygons to identify overlapping area. The overlapping area is defined as the location to be probed. A driving signal is applied to a stage to align a prober with the location to be probed.
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Suri Hitesh
Woods Gary
Bach Joseph
Credence Systems Corporation
Raymond Edward
Sughrue & Mion, PLLC
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