Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
Reexamination Certificate
2006-06-28
2008-12-30
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Error count or rate
C714S738000, C714S025000, C714S735000, C375S221000, C370S236100
Reexamination Certificate
active
07472318
ABSTRACT:
A method and system for evaluating performance of a device by on-chip determination of BER may include establishing and generating PRBS test packets in a closed communication path internally within a physical layer device (PLD) and a remote PLD. A BER for the PLD may be determined from within the PLD based on a comparison of at least a portion of the generated test packets with at least a portion of the generated test packets transmitted over the closed communication path received by the PLD via the closed communication path from the remote PLD. A transmit path of the PLD may be internally coupled to a receive path of the PLD, and a receive path of the PLD may be internally coupled to a transmit path of the PLD. The PLD may be internally configured to operate in an internal optical loopback mode or an internal electrical loopback mode.
REFERENCES:
patent: 5956370 (1999-09-01), Ducaroir et al.
patent: 6028845 (2000-02-01), Serikawa et al.
patent: 6894985 (2005-05-01), Billhartz
patent: 7082556 (2006-07-01), Fishman et al.
patent: 7151893 (2006-12-01), Hayashi et al.
patent: 7218861 (2007-05-01), Totsuka et al.
patent: 2003/0031398 (2003-02-01), Franke et al.
patent: 2003/0149921 (2003-08-01), Lau et al.
patent: 2003/0185571 (2003-10-01), Lee et al.
patent: 2005/0163047 (2005-07-01), McGregor et al.
patent: 2006/0159025 (2006-07-01), Abdo et al.
patent: 0905940 (1999-03-01), None
patent: 9836609 (1998-08-01), None
Fan Nong
Hoang Tuan
Jiang Hongtao
Broadcom Corporation
McAndrews Held & Malloy Ltd.
Trimmings John P
LandOfFree
System and method for determining on-chip bit error rate... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for determining on-chip bit error rate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for determining on-chip bit error rate... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4047087