Coating processes – Coating by vapor – gas – or smoke
Reexamination Certificate
2011-06-28
2011-06-28
Meeks, Timothy H (Department: 1715)
Coating processes
Coating by vapor, gas, or smoke
C118S719000, C118S726000
Reexamination Certificate
active
07968145
ABSTRACT:
A method and apparatus for depositing a film on a substrate includes introducing a material and a carrier gas into a heated chamber. The material may be a semiconductor material, such as a cadmium chalcogenide. A resulting mixture of vapor and carrier gas containing no unvaporized material is provided. The mixture of vapor and carrier gas are remixed to achieve a uniform vapor/carrier gas composition, which is directed toward a surface of a substrate, such as a glass substrate, where the vapor is deposited as a uniform film.
REFERENCES:
patent: 3858548 (1975-01-01), Tick
patent: 3954423 (1976-05-01), Hamper et al.
patent: 3966127 (1976-06-01), Pytlewski
patent: 4512868 (1985-04-01), Fujimura et al.
patent: 4606776 (1986-08-01), Salis
patent: 4987284 (1991-01-01), Fujimura et al.
patent: 5445973 (1995-08-01), Hedström
patent: 5837320 (1998-11-01), Hampden-Smith et al.
patent: 5994642 (1999-11-01), Higuchi et al.
patent: 6037241 (2000-03-01), Powell et al.
patent: 6444043 (2002-09-01), Gegenwart et al.
patent: 6660328 (2003-12-01), Dahmen et al.
patent: 2002/0129769 (2002-09-01), Kim et al.
patent: 2004/0031442 (2004-02-01), Yamazaki et al.
US Pat 4,606,776—Derwent abstract.
Coleman Todd Alden
Gray Andrew Kelly
Powell Ricky Charles
Dickstein & Shapiro LLP
First Solar, Inc.
Meeks Timothy H
Miller, Jr. Joseph
LandOfFree
System and method for depositing a material on a substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for depositing a material on a substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for depositing a material on a substrate will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2623871