Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-03-04
2008-03-04
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11142566
ABSTRACT:
The present invention provides a system and method for providing a standard cell library for reduced leakage and improved performance. The standard cell library comprises at least two sets of threshold voltage cells. At least one of the sets includes non-mixed threshold voltage cells. At least one of the sets includes mixed threshold voltage cells. The mixed threshold voltage cells have at least one threshold voltage cell having a first threshold voltage and a second threshold voltage cell having a second threshold voltage. The first and second threshold voltages are different. The mixed threshold voltage cells have substantially the same footprint as the non-mixed threshold voltage cell.
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Sawyer Law Group LLP
Siek Vuthe
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