System and method for controlling an etch line

Details System and method for controlling an etch line System and method for controlling an etch line

1982-11-12

1983-08-23

Powell, William A.

Adhesive bonding and miscellaneous chemical manufacture

Delaminating processes adapted for specified product

Delaminating in preparation for post processing recycling step

156644, 156345, 356429, C23F 102, B44C 122, C03C 1500, C03C 2506

Patent

active

044002335

ABSTRACT:
An etch line for etching apertures in a sheet of material is controlled by measuring the energy transmission capabilities of the apertures immediately after initially rinsing the sheet. A second energy transmission capability measurement is made after the sheet is fully dried. The results of the two measurements are combined to produce a predicted transmission signal which is used to control a parameter of the etching process.

REFERENCES:
patent: 3918815 (1975-11-01), Gadbois
patent: 3955095 (1976-05-01), Gadbois
patent: 4013498 (1977-03-01), Frantzen
patent: 4124437 (1978-11-01), Bond et al.
patent: 4126510 (1978-11-01), Moscony et al.
patent: 4289406 (1981-09-01), Maddox

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