Image analysis – Applications – Manufacturing or product inspection
Patent
1998-02-19
2000-02-22
Mancuso, Joseph
Image analysis
Applications
Manufacturing or product inspection
382232, G06K 900
Patent
active
06028952&
ABSTRACT:
A system and method to reduce, compress, and analyze the raw data obtained in an apparatus which measures the time-resolved emission of light from an operating integrated circuit is described. The system and method reduce the storage requirements for a tool which measures this emission, and can also reduce the computational time for analysis of the data.
REFERENCES:
patent: 4704522 (1987-11-01), Hirai et al.
patent: 4811090 (1989-03-01), Khurana
patent: 5694211 (1997-12-01), Ohska et al.
Kash Jeffrey Alan
Knebel Daniel R.
Sanda Pia Naoko
Tsang James Chen-Hsiang
Bali Vikkram
International Business Machines - Corporation
Jordan, Esq Kevin M.
Mancuso Joseph
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