4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Pia Naoko Sanda

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Method for IC fault analysis using programmable built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method for identifying long paths in integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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System and method for compressing and analyzing time-resolved op

Image analysis – Applications – Manufacturing or product inspection
Patent

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Using time resolved light emission from VLSI circuit devices...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-756961

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