Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-08-17
2008-10-28
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07444600
ABSTRACT:
Systems and methods for the noise analysis of circuits are presented. These systems and methods may allow a circuit or circuit design to be analyzed for possible noise failures in a block of logic caused by sources. outside the block. More particularly, these systems and methods may generate an abstract file for one or more blocks of a circuit. These abstract files may include noise tolerances for input pins and bi-directional pins of a block, along with noise tolerances for those output pins of the block which also feed to an input of one or more gates internal to the block. Using these noise abstracts a unit of the circuit may be analyzed, or the circuit itself may be analyzed for possible noise induced failures.
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Kameyama Atsushi
Konanki Sunil
Sitko Michael Henry
Do Thuan
Kabushiki Kaisha Toshiba
Sprinkle IP Law Group
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