Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-08-02
2008-11-18
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07454719
ABSTRACT:
A method involves: accessing data representing an interconnect model, where the interconnect model includes a driving point node and is not a lumped capacitance model; calculating a value of an effective capacitance of the interconnect model to be inversely proportional to a voltage at the driving point node of the interconnect model; and storing the value of the effective capacitance. Such a method can be used to calculate effective capacitance of the interconnect model using analytical techniques.
REFERENCES:
patent: 5790415 (1998-08-01), Pullela et al.
patent: 6314546 (2001-11-01), Muddu
patent: 6496960 (2002-12-01), Kashyap et al.
patent: 6601223 (2003-07-01), Puri et al.
patent: 6721929 (2004-04-01), Li et al.
Campbell Stephenson LLP
Dinh Paul
NEC Electronics America, Inc.
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