Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-09-05
2006-09-05
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S186000, C702S188000
Reexamination Certificate
active
07103495
ABSTRACT:
Systems and methods for controlling test conditions using logic built-in self-test (LBIST) components to affect test conditions. In one embodiment, an LBIST controller is coupled to LBIST circuitry that is incorporated into the design of a device under test, and also to a thermal sensor that is in thermal communication with the device under test. The LBIST controller is configured to receive device temperature information from the thermal sensor and to modify control signals that are provided to the LBIST circuitry in order to cause the LBIST circuitry to operate in a manner that drives the device temperature to a desired level. In one embodiment, the LBIST controller adjusts the speed with which the LBIST circuitry scans data into and out of a plurality of scan chains, thereby adjusting the amount of heat generated by this operation, which in turn affects the temperature of the device.
REFERENCES:
patent: 5954832 (1999-09-01), LeBlanc
patent: 5983380 (1999-11-01), Motika et al.
patent: 6407567 (2002-06-01), Etter
patent: 6760873 (2004-07-01), Hao et al.
patent: 2002/0121913 (2002-09-01), Miller et al.
patent: 2004/0103355 (2004-05-01), Correale et al.
Hoff Marc S.
Kabushiki Kaisha Toshiba
Law Offices of Mark L. Berrier
Suarez Felix
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