Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-06-20
2006-06-20
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07065722
ABSTRACT:
A method for constructing a binary decision diagram (BDD) is provided that includes constructing a first BDD data structure operable to reflect a function associated with a target circuit, the first BDD data structure may be constructed using a first script that includes a first set of parameters such that the first BDD data structure exceeds a major threshold value. The method also includes constructing a second BDD data structure using a second script that includes a second set of parameters which reflect a modification to the first set of parameters, the modification reflecting an attempt to minimize a size associated with a node level of the second BDD data structure and being based on a minor threshold value that was identified in association with building the first BDD data structure.
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Doan Nghia M.
Fujitsu Limited
Garbowski Leigh M.
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