Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-05-21
2010-11-30
Nguyen, Tuan T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S200000, C365S185090
Reexamination Certificate
active
07843747
ABSTRACT:
A system for testing logic circuits for executing writing and reading operations in a one-time programmable (OTP) memory having an array of memory cells is disclosed, the system comprising a column of testing cells having the same number of cells as that of an entire column of the array of memory cells, a row of testing cells having the same number of cells as that of an entire row of the array of memory cells, wherein both the column and row of testing cells are first written to and then read out from during a testing operation, and can never be accessed during non-testing operations of the OTP memory.
REFERENCES:
patent: 6031772 (2000-02-01), Nagatomo
patent: 6515923 (2003-02-01), Cleeves
Chen Po-Hung
Chung Shine
Fang Wen-Kuan
Hsueh Fu-Lung
K&L Gates LLP
Le Toan
Nguyen Tuan T
Taiwan Semiconductor Manufacturing Co. Ltd.
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