Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2005-09-16
2008-09-30
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S189070, C714S723000
Reexamination Certificate
active
07430145
ABSTRACT:
According to one embodiment, a method comprises detecting a defect in a portion of memory. The method further comprises designating the portion of memory as defective, and avoiding attempts to access the portion of memory designated as defective.
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Morrganti Charles
Weiss Donald R.
Wuu John
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