System and method for automatically calculating parameters...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

07409649

ABSTRACT:
A system for automatically calculating parameters of an MOSFET is disclosed. The parameter calculating system runs in a computer. The parameter calculating system is used for receiving values input by the users, and for calculating parameters of the MOSFET according to the input values. The parameter calculating system includes a type selecting module (110), a value receiving module (120), a number determining module (130), a parameter calculating module (140), and a circuit netlist generating module (150). A related method is also disclosed.

REFERENCES:
patent: 5818260 (1998-10-01), Kuo
patent: 6046641 (2000-04-01), Chawla et al.
patent: 6313690 (2001-11-01), Ohshima
patent: 6637930 (2003-10-01), Butchers et al.
patent: 2004/0009643 (2004-01-01), Blanchard

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