Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-28
2008-08-05
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07409649
ABSTRACT:
A system for automatically calculating parameters of an MOSFET is disclosed. The parameter calculating system runs in a computer. The parameter calculating system is used for receiving values input by the users, and for calculating parameters of the MOSFET according to the input values. The parameter calculating system includes a type selecting module (110), a value receiving module (120), a number determining module (130), a parameter calculating module (140), and a circuit netlist generating module (150). A related method is also disclosed.
REFERENCES:
patent: 5818260 (1998-10-01), Kuo
patent: 6046641 (2000-04-01), Chawla et al.
patent: 6313690 (2001-11-01), Ohshima
patent: 6637930 (2003-10-01), Butchers et al.
patent: 2004/0009643 (2004-01-01), Blanchard
Hon Hai Precision Industry Co. Ltd.
Hsu Winston
Siek Vuthe
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