System and method for automatically calculating parameters...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

11308639

ABSTRACT:
A system for automatically calculating parameters of an MOSFET is disclosed. The parameter calculating system runs in a computer. The parameter calculating system is used for receiving values inputted, and for calculating parameters of the MOSFET according to the input values. The parameter calculating system includes an operation selecting module (110), a value receiving module (120), a judging module (130), a parameter calculating module (140), and a circuit netlist generating module (150). A related method is also disclosed.

REFERENCES:
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patent: 5838022 (1998-11-01), Maeda
patent: 6637930 (2003-10-01), Butchers et al.
patent: 6779157 (2004-08-01), Kondo
patent: 2004/0009643 (2004-01-01), Blanchard
patent: 2006/0236272 (2006-10-01), Chen
patent: 2007/0004054 (2007-01-01), Orr
Bendix, “Subtleties of SPICE Mosfet Parameter Extraction”, Mar. 1989, IEEE 1989 International Conference on Microelectronic Test Structure, vol. 2, No. 1, pp. 65-68.

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