Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-03-25
2008-03-25
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11308639
ABSTRACT:
A system for automatically calculating parameters of an MOSFET is disclosed. The parameter calculating system runs in a computer. The parameter calculating system is used for receiving values inputted, and for calculating parameters of the MOSFET according to the input values. The parameter calculating system includes an operation selecting module (110), a value receiving module (120), a judging module (130), a parameter calculating module (140), and a circuit netlist generating module (150). A related method is also disclosed.
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Chung Wei Te
Hon Hai Precision Industry Co. Ltd.
Lin Sun James
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