System and method for analyzing length differences in...

Details System and method for analyzing length differences in... System and method for analyzing length differences in...

2006-10-26

2009-08-25

Rossoshek, Helen (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07581200

ABSTRACT:
A method for analyzing length differences in differential signal paths includes: loading a design file of the differential signal paths from a storage device (9); simulating the differential signal paths based on the design file; dividing simulated differential signal paths into a plurality of segments by impedance division positions that show impedance discontinuity; predefining an acceptable length difference limit for each divided segment, and calculating an real length difference for each divided segment; comparing the real length difference with the acceptable length difference limit correspondingly to generate a plurality of analyzed results corresponding to the plurality of divided segments; selecting one or more compared segments to check analyzed results of selected segments; and locating the selected segments in the simulated differential signal paths, and generating analyzed information comprising analyzed results of the selected segments. A related system is also disclosed.

REFERENCES:
patent: 6185119 (2001-02-01), Haeberli et al.
patent: 6235997 (2001-05-01), Asada et al.
patent: 6442069 (2002-08-01), Srinivasan et al.
patent: 6643831 (2003-11-01), Chang et al.
patent: 6765413 (2004-07-01), Nakase
patent: 6781465 (2004-08-01), Berzins et al.
patent: 7277298 (2007-10-01), Ohsaka
patent: 7307492 (2007-12-01), Tripathi et al.
patent: 7346880 (2008-03-01), Huang et al.
patent: 7421673 (2008-09-01), Meyer et al.

Affiliated with

Also associated with

Rating

System and method for analyzing length differences in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for analyzing length differences in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for analyzing length differences in... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4088012