Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-11-06
2007-11-06
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11056850
ABSTRACT:
There is provided a system and method for statistical timing analysis of an electrical circuit. The system includes at least one parameter input, a statistical static timing analyzer, and at least one output. The at least one parameter input is for receiving parameters of the electrical circuit. At least one of the parameters has at least one of a non-Gaussian probability distribution and a non-linear delay effect. The statistical static timing analyzer is for calculating at least one of a signal arrival time and a signal required time for the electrical circuit using the at least one parameter. The at least one output is for outputting the at least one of the signal arrival time and the signal required time.
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Chang Hongliang
Narayan Sambasivan
Visweswariah Chandramouli
Zolotov Vladimir
Chiang Jack
Doan Nghia M.
Keusey, Tutunjian & & Bitetto, P.C.
Wardas Mark
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