Synchronous stress test control

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit

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Details

327143, 327202, 327213, H03K 513

Patent

active

057125848

ABSTRACT:
The present invention ensures that the entire data path of the synchronous integrated circuit device composed of master and slave latches is initialized upon power-up in a test mode, thereby overcoming a prior art problem of non-initialization of the device data path. In the test mode, the master clock signal is initialized internally to the synchronous integrated circuit device to allow the master latch to conduct. A clock signal which is a derivative of a master clock signal is controlled to be equal to a first logic state in order to control a slave latch element of the synchronous integrated circuit device to conduct, regardless of the state of the master clock signal. Controlling the clock signal to be equal to the first logic state allows the clock signal to be able to control the slave latch element so that entire data path of the integrated circuit device is initialized upon power-up of the device in the test mode. The logic state of the clock signal is controlled by a clock control circuit which sets the logic state of the clock as a function of whether the device is in a test mode. Thus, the master clock signal which controls the master latch element and the clock signal which controls the slave latch element are controlled such that the master latch and the slave latch conduct simultaneously for proper and full initialization of the device data path upon power-up of the device in a test mode.

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