Surface state inspecting method and substrate inspecting...

Optics: measuring and testing – Shape or surface configuration – By specular reflection

Reexamination Certificate

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C382S150000, C356S237100, C356S237500

Reexamination Certificate

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06947151

ABSTRACT:
In a substrate inspecting apparatus comprising a projecting section (4) in which light sources (8), (9) and (10) are provided for emitting colored lights of R, G and B in directions having different elevation angles, one or two color components which is/are greater than the mean value of the intensities of color components is/are extracted for an inspecting region including a soldered portion. Inclined surfaces adapted to the light sources (8), (9) and (10) are converted into monochromatic shaded images by the extraction processing. A boundary position between the inclined surfaces adapted to the light sources (8) and (9) are converted into one shaded image having a mixed color of red and green and the boundary position between the inclined surfaces adapted to the light sources (9) and (10) is converted into a different shaded image.

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patent: 62-127617 (1987-06-01), None
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David W. Capson et al., “A Tiered-Color Illumination Approach for Machine Inspection of Solder Joints”, IEEE Transactions on Pattern Analysis and Machine Intelligence, May 1988, pp. 387-393, vol. 10, No. 3, XP-002243987.
“Multiple-Image Vision Inspection Process”, IBM Technical Disclosure Bulletin, Sep. 1987, pp. 1647-1649, vol. 30, No. 4, XP 000021763.

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