Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-05-01
2000-03-21
Hantis, K. P.
Optics: measuring and testing
By polarized light examination
With light attenuation
250548, 2505593, 356401, G01B 1114
Patent
active
060409096
ABSTRACT:
A detecting system for detecting positional information related to a surface of an object. The detecting system includes a variable pattern generator for projecting an arbitrary pattern image on the surface of the object, a light projecting optical system for projecting a pattern, defined by the variable pattern generator, to the surface of the object along an oblique direction, a light receiving optical system for directing light from an image of the pattern and a light receiving element for detecting the light directed by the light receiving optical system. Surface position information about the surface of the object is detected on the basis of the detection by the light receiving element.
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Hasegawa Masanobu
Ohsaki Yoshinori
Yoshii Minoru
Canon Kabushiki Kaisha
Hantis K. P.
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