4. Optics: measuring and testing
  5. By polarized light examination

Yoshinori Ohsaki

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Aligning method, exposure apparatus using this aligning...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature
Reexamination Certificate

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Apparatus and method for measuring optical anisotropy

Optics: measuring and testing – Of light reflection
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Apparatus and method for measuring optical anisotropy

Optics: measuring and testing – By polarized light examination
Patent

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Apparatus and method for measuring optical anisotropy

Optics: measuring and testing – Of light reflection
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Apparatus for measuring optical characteristics

Optics: measuring and testing – Material strain analysis – With polarized light
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