Surface polishing of silicon carbide electronic device substrate

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

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438492, 438690, 438931, 438959, 438974, H01L 21306

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active

057504342

ABSTRACT:
A silicon carbide substrate is dry-polished using chromium oxide Cr.sub.2 O.sub.3, ion oxide Fe.sub.2 O.sub.3, or cerium oxide CeO.sub.2 to obtain a good polished surface free of mechanical defects and with less crystal distortion. Films are then formed on the surface to create an improved electronic device.

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