Optics: measuring and testing – Of light reflection
Reexamination Certificate
2011-08-16
2011-08-16
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Of light reflection
Reexamination Certificate
active
07999941
ABSTRACT:
A metal layer13made of Au or the like is formed on the upper surface of a transparent substrate12.Dielectric layers14a,14band14cwith different thicknesses are formed on the upper surface of the metal layer13(any one of the dielectric layers can have a thickness of 0) to form respective determination areas15a,15band15c.Further, different types of antibodies22a,22band22care fixed on the upper surfaces of the respective dielectric layers14a,14band14c.Then, light is directed to the determination areas15a,15band15c,then signals of light reflected by the determination areas15a,15band15care received, the light is dispersed, and analyses are performed on signals resulted from the light dispersion to detect the conditions of the surfaces of the respective determination areas, at the same time.
REFERENCES:
patent: 6728429 (2004-04-01), Melman et al.
patent: 6752963 (2004-06-01), Dickopf et al.
patent: 2003/0107741 (2003-06-01), Pyo et al.
patent: 2003/0113231 (2003-06-01), Karube et al.
patent: 2008/0163688 (2008-07-01), Wang et al.
patent: 2001-337036 (2001-12-01), None
patent: 2002-162346 (2002-06-01), None
patent: 2003-322610 (2003-11-01), None
patent: 3576093 (2004-07-01), None
patent: 3726772 (2005-07-01), None
International Search Report w/translation from PCT/JP2007/055134 dated May 15, 2007 (4 pages).
espacenet.com Abstract of JP2001-337036 dated Dec. 7, 2001; Karube Masao (2 pages).
espacenet.com Abstract JP2003-322610 dated Nov. 14, 2003; Omron Tateisi Electronics Co. (2 pages).
espacenet.com Abstract of JP2002-162346 dated Jun. 7, 2002; Nippon Telegraph & Telephone (2 pages).
Written Opinion from PCT/JP2007/055134 dated May 15, 2007 (3 pages).
International Preliminary Report on Patentability dated Jul. 1, 2008 (5 pages).
Aoyama Shigeru
Hasui Ryosuke
Matsushita Tomohiko
Moriyama Megumi
Nishikawa Takeo
Omron Corporation
Osha • Liang LLP
Stafira Michael P
LandOfFree
Surface plasmon resonance sensor chip and surface plasmon... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface plasmon resonance sensor chip and surface plasmon..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface plasmon resonance sensor chip and surface plasmon... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2709157