Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1985-08-26
1988-04-12
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
047370327
ABSTRACT:
The invention is an apparatus having an improved arrangement of sensing and illumination elements for high speed, non-contact, three-dimensional mensuration of a surface. The surface is illuminated by a single plane of light producing a contour line. The line is viewed from two or more vantage points, alleviating shadowing from many types of large surface irregularities. The geometry of the apparatus is tolerant of moving surfaces, allows higher data rates and has great depth of field for the sensor.
REFERENCES:
patent: 3796492 (1974-03-01), Cullen et al.
patent: 3918816 (1975-11-01), Foster et al.
patent: 3986774 (1976-10-01), Lowrey, Jr. et al.
patent: 4238147 (1980-12-01), Stern
patent: 4297034 (1981-10-01), Ito et al.
patent: 4529305 (1985-07-01), Welford et al.
patent: 4529316 (1985-07-01), DiMatteo
patent: 4531837 (1985-07-01), Panetti
patent: 4563094 (1986-01-01), Yamada
Addleman David A.
Addleman Lloyd A.
Cyberware Laboratory Inc.
Evans F. L.
Fihe Paul B.
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