Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-12-26
2010-02-23
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C345S087000
Reexamination Certificate
active
07667481
ABSTRACT:
A surface electron emission device array and a TFT inspection system for inspecting a TFT array using a surface electron emission device array may be provided. The TFT inspection system may include a surface electron emission device array, which may have a first electrode disposed to face the TFT array in a first direction, a second electrode disposed in a second direction intersecting the first direction in a region corresponding to a region in which the first electrode and a corresponding pixel electrode of the TFT array may be formed, and an insulating layer interposed between the first electrode and the second electrode.
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Korean Office Action dated Nov. 9, 2006.
Bourim El Mostafa
Lee Seung-Woon
Lee Sung-Jin
Moon Chang-Wook
Harness Dickey & Pierce PLC
Nguyen Ha Tran T
Samsung Electronics Co,. Ltd.
Vazquez Arleen M
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