Surface analysis instrument and method of displaying images usin

Details Surface analysis instrument and method of displaying images usin Surface analysis instrument and method of displaying images usin

1996-04-04

1998-04-28

Boudreau, Leo

Image analysis

Histogram processing

With pattern recognition or classification

382108, 382171, 382282, G06K 900

Patent

active

057455953

ABSTRACT:
A surface analysis instrument such as an electron probe microanalyzer. The instrument makes surface analyses of different regions on a sample and displays images of the regions according to the obtained information at different positions on the viewing screen of a display unit. The instrument creates a mixed histogram of the regions from the information about the regions. A level assortment is carried out according to the mixed histogram. Information about the level assortment is stored in a memory. Colors are assigned to images of the different regions according to the information about the level assortment. The images are displayed at different positions on the viewing screen.

REFERENCES:
patent: 4847786 (1989-07-01), Wang et al.
patent: 4857731 (1989-08-01), Tagata
patent: 5332968 (1994-07-01), Brown
"Phase Analysis by Computer Processing in EPMA (Electron Probe Microanalyzer)", Hideyuki Takahashi, Masayuki Otsuki and Toyohiko Okumura, JEOL News, vol. 31E, No. 1 28 (1994), pp. 28-32.

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