Suppression of dark current in a photosensor for imaging

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S093000

Reexamination Certificate

active

07576376

ABSTRACT:
A pixel cell having a halogen-rich region localized between an oxide isolation region and a photosensor. The halogen-rich region prevents leakage from the isolation region into the photosensor, thereby suppressing dark current in imagers.

REFERENCES:
patent: 5485019 (1996-01-01), Yamazaki et al.
patent: 5618379 (1997-04-01), Armacost et al.
patent: 5985689 (1999-11-01), Gofuku et al.
patent: 6211040 (2001-04-01), Liu et al.
patent: 6271554 (2001-08-01), Nozaki et al.
patent: 6362040 (2002-03-01), Tews et al.
patent: 6566722 (2003-05-01), Lin et al.
patent: 6780666 (2004-08-01), McClure
patent: 2003/0143812 (2003-07-01), Lin
patent: 2004/0065882 (2004-04-01), Yamazaki et al.
patent: 2004/0250392 (2004-12-01), Chou et al.
patent: 2005/0001248 (2005-01-01), Rhodes
patent: 2005/0045926 (2005-03-01), Mouli
patent: 2005/0112833 (2005-05-01), Hareland et al.
patent: 2005/0145902 (2005-07-01), Mouli
patent: 2006/0008938 (2006-01-01), Mouli et al.
patent: 2006/0138470 (2006-06-01), Han
patent: 2006/0246714 (2006-11-01), Derraa
Singapore Patent Office Communication issued Feb. 19, 2007.
Chapter 1, “Ionizing radiation effects on MOS devices and Ics”, pp. 35-62.
B.C. Burkey et al., “The Pinned Photodiode for an Interline-Transfer CCD Image Sensor”, CH2099-0/84/0000-0028, 1984.
Masahiro Ushiyama et al., “Suppression of Anomalous Leakage Current in Tunnel Oxides by Fluorine Implantation to Realize Highly Reliable Flash Memory,” 1999 Symposium on VLSI Technology Digest of Technical Papers.
Kiyonori Ohyu et al., “Improvement of SiO2/Si Interface Properties Utilising Fluorine Ion Implantation and Drive-in Diffusion,” Japanese Journal of Applied Physics, vol. 28, No. 6, Jun. 1989, pp. 1041-1045.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Suppression of dark current in a photosensor for imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Suppression of dark current in a photosensor for imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Suppression of dark current in a photosensor for imaging will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4106532

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.