Support-integrated donor wafers for repeated thin donor...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation

Reexamination Certificate

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C438S455000, C438S409000, C438S456000, C438S457000, C438S479000, C438S435000, C438S753000, C438S954000, C438S690000, C438S459000

Reexamination Certificate

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06908828

ABSTRACT:
Processes that may be used in producing electronic, optoelectronic, or optical components may be provided. The processes may involve preparing a reusable donor wafer for donating a thin layer of semiconductor material by assembling a donor layer of a semiconductor material having a thickness of plural thin layers onto a support layer of. The semiconductor material for the support layer may be selected to be less precious or to have a lower quality than the donor layer. The support layer may have sufficient mechanical characteristics for supporting the donor layer during desired semiconductor processing treatments.

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