Substrate used for immersion lithography process, method of...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S272100

Reexamination Certificate

active

07816070

ABSTRACT:
A substrate having a photoresist film, capable of easily performing immersion lithography with high precision and stability, is provided. A surface tension of the substrate in a periphery region is lower than that of the substrate in a rest region. Immersion liquid supplied onto the photoresist film hardly leaks out, and the bubbles hardly occur in the immersion liquid.

REFERENCES:
patent: 2002/0110760 (2002-08-01), Lin
patent: 2007/0066080 (2007-03-01), Kugler et al.
patent: A-2005-183709 (2005-07-01), None
patent: A-2006-019742 (2006-01-01), None
patent: A-2006-108564 (2006-04-01), None
patent: A-2006-186112 (2006-07-01), None
patent: 20030002323 (2003-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Substrate used for immersion lithography process, method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrate used for immersion lithography process, method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate used for immersion lithography process, method of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4184283

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.