Substrate temperature control in an ALD reactor

Coating apparatus – Gas or vapor deposition – With treating means

Reexamination Certificate

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Details

C156S345510, C156S345520, C156S345530, C361S234000, C279S128000

Reexamination Certificate

active

07806983

ABSTRACT:
A deposition system includes a process chamber for conducting an ALD process to deposit layers on a substrate. An electrostatic chuck (ESC) retains the substrate. A backside gas increases thermal coupling between the substrate and the ESC. The ESC is cooled via a coolant flowing through a coolant plate and heated via a resistive heater. Various arrangements are disclosed.

REFERENCES:
patent: 4058430 (1977-11-01), Suntola et al.
patent: 4389973 (1983-06-01), Suntola et al.
patent: 4413022 (1983-11-01), Suntola et al.
patent: 5091207 (1992-02-01), Tanaka
patent: 5567267 (1996-10-01), Kazama et al.
patent: 5584971 (1996-12-01), Komino
patent: 5622593 (1997-04-01), Arasawa et al.
patent: 5801915 (1998-09-01), Kholodenko et al.
patent: 5810933 (1998-09-01), Mountsier et al.
patent: 5835334 (1998-11-01), McMillin et al.
patent: 5855675 (1999-01-01), Doering et al.
patent: 5879459 (1999-03-01), Gadgil et al.
patent: 5916365 (1999-06-01), Sherman
patent: 5972430 (1999-10-01), DiMeo, Jr. et al.
patent: 6012509 (2000-01-01), Nonaka
patent: 6015590 (2000-01-01), Suntola et al.
patent: 6033482 (2000-03-01), Parkhe
patent: 6056850 (2000-05-01), Blalock et al.
patent: 6063202 (2000-05-01), Cleary et al.
patent: 6174377 (2001-01-01), Doering et al.
patent: 6186092 (2001-02-01), Tsai et al.
patent: 6200893 (2001-03-01), Sneh
patent: 6342277 (2002-01-01), Sherman
patent: 6383955 (2002-05-01), Matsuki et al.
patent: 6406545 (2002-06-01), Shoda et al.
patent: 6428850 (2002-08-01), Shinriki et al.
patent: 6500299 (2002-12-01), Mett et al.
patent: 2001/0048981 (2001-12-01), Suzuki
patent: 2001/0050039 (2001-12-01), Park
patent: 2003/0095370 (2003-05-01), Tsuruta et al.
patent: 1 052 309 (2000-10-01), None
patent: WO 00/16377 (2000-03-01), None
patent: WO 00/79576 (2000-12-01), None
Peter Singer, Editor-in-chief, “Atomic Layer Deposition Targets Thin Films,” Semiconductor International, Sep. 1999, (p. 40).
“Ultra-thin films byu atomic layer deposition,” American Xtal Technology, Oct. 1999 (p. 37).
S. M. Rossnagel, IBM Research, A sherman and F. Turner, Sherman and Asosciates, plasma-enhanced atomic layer deposition of Ta and Ti for interconnect diffusion barriers, J. Vac. Sci. Technol. B 18(4), Jul./Aug. 2000. (pp. 2016-2020).
T.P. Chiang et al., “Ion-induced chemical vapor deposition of high purity Cu films at room temperature using a microwave discharge H atom beam source,” J.Vac.Sci.Technol. A 15(5), Sep./Oct. 1997, pp. 2677-2686.
T.P.Chiang et al., “Surfaced kinetic sturdy of ion-induced chemical vapor deposition of copper for focused ion beam applications,” J.Vac.Sci.Technol. A 15(6), Nov./Dec. 1997, pp. 3104-3114.
X. Chen et al., “Low temperature plasma-promoted chemical vapor deposition of tantalum from tantalum pentabromide for copper metallization,” J.Vac.Sci.Technol. B 16(5), Sep./Oct. 1998, pp. 2887-2890.
X. Chen et al., “Low temperature plasma-assisted chemical vapor deposition of tantalum from tantalum pentabromide for copper metallization,” J.Vac.Sci.Technol. B 17(1), Jan./Feb. 1999, pp. 182-185.
P. Martensson, “Atomic Layer Epitaxy of Copper,” Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology 421, 1999, pp. 1-45, Acta Universitis Upsaliensis, Uppsala, Sweden.
P.Martensson et al., “Atomic Layer Epitaxy of Copper on Tantalum,” Chemical Vapor Deposition, 1997. pp. 45-50, vol. 3, No. 1.
M.Ritala et al, “Controlled Growth of TaN, Ta3N5, and TaOxNy Thin Films by Atomic Layer Deposition,” Chemical Materials, vol. 11, No. 7, 1999, American Chemical Society, pp. 1712-1718.
Goto et al., “Atomic Layer Controlled Deposition of Silicon Nitride With Self-Limiting Mechanism,” Appl. Phys. Lett (23)(Jun. 3, 1996) pp. 3257-3259.
K.A. Ashtiani et al., “A New Hollow-Cathode Magnetron Source for 0.10 um Copper Applications,” Novellus Systems, Inc. San Jose, CA, (date unknown), 3 pages.

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