Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2008-08-15
2011-12-27
Garber, Charles (Department: 2812)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C257SE21240
Reexamination Certificate
active
08084372
ABSTRACT:
In the present invention, a coating solution containing polysilazane is applied to a substrate to form a coating film. Thereafter, an ultraviolet ray is applied to the coating film formed on the substrate to cut a molecular bond of polysilazane in the coating film. Then, the coating film in which the molecular bond of polysilazane has been cut is oxidized while the coating film is being heated. Then, the oxidized coating film is baked at a baking temperature equal to or higher than a heating temperature when the coating film is oxidized.
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Office Action issued Jul. 26, 2011, in Japanese Patent Application No. JP2008-192129 with English Translation.
Fujii Hiroyuki
Muramatsu Makoto
Nishi Takanori
Terada Shouichi
You Gen
Choi Calvin
Garber Charles
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tokyo Electron Limited
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