Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2006-09-05
2006-09-05
Lee, Hsien-Ming (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
C438S706000, C438S708000, C438S113000, C438S460000, C219S121600, C219S121670, C219S121680
Reexamination Certificate
active
07101797
ABSTRACT:
In a state where a process gas including SF.sub. 6 and O.sub. 2 is supplied in a chamber, a laser light irradiator provided outside the chamber irradiates a laser light onto a substrate. At the portion of the substrate onto which the laser light is irradiated, the material that makes up the substrate is excited and converted into a gaseous substance by reacting with the process gas. The temperature of the substrate placed on a stage is kept at a predetermined temperature since a temperature adjuster supplies a chiller to a coolant flow passage provided inside the stage.
REFERENCES:
patent: 4643799 (1987-02-01), Tsujii et al.
patent: 5328558 (1994-07-01), Kawamura
patent: 5912186 (1999-06-01), Yoshino et al.
patent: 6368977 (2002-04-01), Narita et al.
patent: 2002/0170891 (2002-11-01), Boyle et al.
patent: S59-71599 (1984-09-01), None
patent: 61-88101 (1986-06-01), None
patent: 64-034363 (1989-02-01), None
patent: 06-120334 (1994-04-01), None
patent: 06-177073 (1994-06-01), None
patent: 09-141645 (1997-06-01), None
patent: 10-034363 (1998-02-01), None
patent: 10-199826 (1998-07-01), None
patent: 10-305420 (1998-11-01), None
patent: 11-050274 (1999-02-01), None
patent: 2001-176820 (2001-06-01), None
patent: 2001-219290 (2001-08-01), None
patent: 2001-230209 (2001-08-01), None
patent: 2002-100825 (2002-04-01), None
patent: 2002-144070 (2002-05-01), None
Crowell & Moring LLP
Lee Hsien-Ming
Tokyo Electron Limited
LandOfFree
Substrate processing device and processing method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Substrate processing device and processing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate processing device and processing method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3554980