Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2007-01-05
2010-11-02
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
Reexamination Certificate
active
07824934
ABSTRACT:
A substrate processing apparatus which enables parameters for carrying out processing on substrates to be changed easily by a user. A storage device stores parameters that are for controlling the processing and are categorized into a plurality of categories. A control device carries out the processing on the substrate based on the parameters. A parameter changing device enables each of the parameters to be changed in accordance with the category of that parameter. A parameter category changing device changes the category of some of the parameters. A category change defining device is detachable from the substrate processing apparatus and specifies parameters whose category is to be changed out of the parameters. The parameter category changing device changes the category of each of the parameters specified by the category change defining device.
REFERENCES:
patent: 2005/0246127 (2005-11-01), Renken et al.
patent: 2006/0134330 (2006-06-01), Ishikawa et al.
patent: 10-125587 (1998-05-01), None
patent: 2000-228348 (2000-08-01), None
Nakamura Yoshiyuki
Yamamoto Yoshihiro
Garber Charles D
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Stevenson Andre′ C
Tokyo Electron Limited
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