Substrate processing apparatus and substrate processing method

Etching a substrate: processes – Nongaseous phase etching of substrate – Recycling – regenerating – or rejunevating etchant

Reexamination Certificate

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C216S083000, C216S084000, C156S345150, C156S345180, C156S345240, C156S345500, C134S010000, C134S033000, C134S104200, C134S109000, C134S113000, C427S240000, C427S421100, C427S425000, C118S052000, C118S602000, C118S712000

Reexamination Certificate

active

06878303

ABSTRACT:
A substrate processing apparatus for supplying a treatment liquid onto the surface of a substrate to treat the same. This apparatus is provided with: a spin chuck for holding and rotating a substrate; a nozzle for supplying a treatment liquid to the substrate held by the spin chuck; a circulating passage arranged such that the treatment liquid supplied to the substrate from the nozzle and used for substrate treatment is circulated to the nozzle and reutilized for substrate treatment; a metal contamination amount measuring device for measuring the metal contamination amount in the treatment liquid passing through the circulating passage; and a judgment processing unit for judging whether or not the value measured by the metal contamination amount measuring device has exceeded a predetermined set value.

REFERENCES:
patent: 6200414 (2001-03-01), Hwang et al.
patent: 6551422 (2003-04-01), O'Connor
patent: 6736926 (2004-05-01), Chopra et al.
patent: 20020036501 (2002-03-01), Astley et al.
patent: 20030132193 (2003-07-01), Okamoto
patent: 63-137430 (1988-06-01), None
patent: 11-345849 (1999-12-01), None

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