Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1991-07-17
1992-06-09
Hudspeth, David
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
3072962, 3072965, 365228, G05F 146
Patent
active
051209934
ABSTRACT:
A substrate bias detection circuit is disclosed. The circuit includes first and second transistors, where the first transistor has its source coupled to the substrate and where the second transistor has its source coupled to a common potential (i.e., ground). The gate and drain of the first transistor are connected together, and to the gate of the second transistor. Load devices are connected between the drains of the first and second transistors and a bias potential from a power supply node. The threshold voltages of the first and second transistors may be different, with the difference determining the voltage that the substrate must reach, relative to the common potential, to cause the circuit to respond. Upon the substrate reaching a voltage sufficient to turn the second transistor on, the drain of the second transistor will be pulled toward the common potential, indicating loss of substrate bias. The circuit may be included into an integrated circuit in such a manner that power supply voltages may be disconnected from other circuitry in the event of loss of substrate bias, precluding the possibility of latchup in such other circuitry.
REFERENCES:
patent: 4739191 (1988-04-01), Puar
Hummel, "Sentry Circuit for Substrate Voltage Control", IBM T.D.B., vol. 15, No. 2 (Jul. 1972).
"Voltage Regulator Circuit for CMOS Substrate Voltage Generator", IBM T.D.B., vol. 28, No. 3, Aug. 1985.
Harrom, "Substrate Bias Voltage Control", IBM T.D.B., vol. 22, No. 7, Dec. 1976.
Iyengar Narasimhan
Tsay Ching-yuh
Doanldson Richard L.
Grossman Rene E.
Holland Robby T.
Hudspeth David
Texas Instruments Incorporated
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