Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2007-10-30
2007-10-30
Coleman, W. David (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257SE51045, C435S285200, C435S287100
Reexamination Certificate
active
10417327
ABSTRACT:
The present invention relates to a substantially planar substrate for use in patch clamp analysis of the electrophysiological properties of a cell membrane comprising a glycocalyx, wherein the substrate comprises an aperture having a rim, the rim being adapted to form a gigaseal upon contact with the cell membrane, The invention further provides a method of making such a substrate and method for analysing the electrophysiological properties of a cell membrane comprising a glycocalyx.
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Kutchinsky Jonatan
Oswald Nicholas
Reuter Dirk
Taboryski Rafael
Vestergaard Ras Kaas
Coleman W. David
Sophion Bioscience A/S
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