Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-13
2005-09-13
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C714S025000, C714S036000
Reexamination Certificate
active
06944836
ABSTRACT:
Structures and methods for testing a re-programmable logic block embedded in a one-time programmable fabric in a PLD. The re-programmable logic block is tested without using the one-time programmable resources needed for implementing user circuits, by including a multiple input signature register (MISR) circuit coupled to receive output data from the re-programmable logic portion of the PLD. In some embodiments, a tester operating at a first and lower clock frequency can be used to test a re-programmable logic block operating at a second and higher clock frequency. In some of these embodiments, the one-time programmable fabric is tested at the first clock frequency.
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Cartier Lois D.
Maunu LeRoy D.
Rossoshek Helen
Thompson A. M.
Xilinx , Inc.
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