Structure of strained silicon on insulator and method of...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies

Reexamination Certificate

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C438S479000, C438S517000, C438S752000, C438S933000, C257S019000, C257SE21570, C257SE21182, C257SE29193, C257SE31049

Reexamination Certificate

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07544585

ABSTRACT:
Provided is a strained SOI structure and a method of manufacturing the strained SOI structure. The strained SOI structure includes an insulating substrate, a SiO2layer formed on the insulating substrate, and a strained silicon layer formed on the SiO2layer.

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