Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies
Reexamination Certificate
2007-12-19
2009-06-09
Huynh, Andy (Department: 2818)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Subsequent separation into plural bodies
C438S479000, C438S517000, C438S752000, C438S933000, C257S019000, C257SE21570, C257SE21182, C257SE29193, C257SE31049
Reexamination Certificate
active
07544585
ABSTRACT:
Provided is a strained SOI structure and a method of manufacturing the strained SOI structure. The strained SOI structure includes an insulating substrate, a SiO2layer formed on the insulating substrate, and a strained silicon layer formed on the SiO2layer.
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Noguchi Takashi
Park Young-soo
Xianyu Wenxu
Buchanan & Ingersoll & Rooney PC
Huynh Andy
Samsung Electronics Co,. Ltd.
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