Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1998-10-14
1999-09-28
Monin, Jr., Donald L.
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257355, 257356, H01L 2358
Patent
active
059593113
ABSTRACT:
An antenna effect monitor includes a transistor formed on a semiconductor substrate. The transistor gate is coupled to a doped polysilicon interconnect layer which is also coupled to an antenna effect monitoring unit. Several metal bonding pads float in an orderly fashion above the doped polysilicon interconnect layer without coupling with each other. Several small metal layers are formed in an orderly fashion above the doped polysilicon interconnect layer but are electrically coupled together by several via plugs in between. The top small metal layer is coupled to the top bonding pad. The bottom small metal layer is electrically coupled to the doped polysilicon interconnect layer. Then a passivation layer covers the substrate but leaves a pad opening to expose the top bonding pad.
REFERENCES:
patent: 5650651 (1997-07-01), Bui
patent: 5726458 (1998-03-01), Bui
Lur Water
Shih Hsueh-Hao
Wang Mu-Chun
Wu Juan-Yuan
Dietrich Michael
Monin, Jr. Donald L.
United Microelectronics Corp.
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