Structure for testing integrated circuits

Details Structure for testing integrated circuits Structure for testing integrated circuits

1994-12-20

1997-11-04

Jackson, Jerome

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

257532, H01L 2358

Patent

active

056843046

ABSTRACT:
An integrated circuit has at least one access pad connected to an element of an internal circuit through a capacitor including two opposed conductive layers insulated one from the other. The lower conductive layer portion is connected to the pad and the upper conductive layer portion is connected to the element. Thus, the upper conductive layer portion forms a d.c. current testing pad.

REFERENCES:
patent: 4801867 (1989-01-01), Suzuki
patent: 4929998 (1990-05-01), Boudewijns
patent: 5420449 (1995-05-01), Oji

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