Structure for on-chip electromigration monitoring system

Details Structure for on-chip electromigration monitoring system Structure for on-chip electromigration monitoring system

2007-11-19

2010-11-23

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

07840916

ABSTRACT:
A design structure embodied in a machine readable medium used in a design process can include apparatus of a semiconductor chip operable to detect an increase in resistance of a monitored element of the semiconductor chip. The design structure can include, for example, a resistive voltage divider circuit operable to output a plurality of reference voltages having different values. A plurality of comparators in the semiconductor chip may be coupled to receive the reference voltages and a monitored voltage representative of a resistance of the monitored element. Each of the comparators may produce an output indicating whether the monitored voltage exceeds the reference voltages, so that the resistance value of the monitored element may be precisely determined.

REFERENCES:
patent: 5264377 (1993-11-01), Chesire et al.
patent: 5514974 (1996-05-01), Bouldin
patent: 6097203 (2000-08-01), Parker et al.
patent: 6147361 (2000-11-01), Lin et al.
patent: 6614251 (2003-09-01), Ootsuji
patent: 6933730 (2005-08-01), Parker et al.
patent: 7211995 (2007-05-01), Ventomaki
patent: 7394273 (2008-07-01), Hsu et al.
patent: 2004/0239413 (2004-12-01), Gubbins
patent: 2005/0077907 (2005-04-01), Parker et al.
patent: 2006/0267621 (2006-11-01), Harris et al.
patent: 2008/0265931 (2008-10-01), Hsu et al.

Affiliated with

Also associated with

Rating

Structure for on-chip electromigration monitoring system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Structure for on-chip electromigration monitoring system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure for on-chip electromigration monitoring system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4226619