Structure and method to fabricate ultra-thin Si channel devices

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S425000

Reexamination Certificate

active

06905941

ABSTRACT:
A method for preventing polysilicon stringer formation under the active device area of an isolated ultra-thin Si channel device is provided. The method utilizes a chemical oxide removal (COR) processing step to prevent stinger formation, instead of a conventional wet etch process wherein a chemical etchant such as HF is employed. A silicon-on-insulator (SOI) structure is also provided. The structure includes at least a top Si-containing layer located on a buried insulating layer; and an oxide filled trench isolation region located in the top Si-containing layer and a portion of the buried insulating layer. No undercut regions are located beneath the top Si-containing layer.

REFERENCES:
patent: 5766971 (1998-06-01), Ahlgren et al.
patent: 5838055 (1998-11-01), Kleinhenz et al.
patent: 5876879 (1999-03-01), Kleinhenz et al.
patent: 6074951 (2000-06-01), Kleinhenz et al.
patent: 6319794 (2001-11-01), Akatsu et al.
patent: 6541351 (2003-04-01), Bartlau et al.
patent: 2002/0022308 (2002-02-01), Ahn et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Structure and method to fabricate ultra-thin Si channel devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Structure and method to fabricate ultra-thin Si channel devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure and method to fabricate ultra-thin Si channel devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3493716

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.