Structure and method for ultra-small grain size polysilicon

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C438S198000, C438S585000

Reexamination Certificate

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06967384

ABSTRACT:
A method of forming a semiconductor structure (and the resulting structure), includes providing a nitride layer between a silicon-containing layer and a polysilicon layer.

REFERENCES:
patent: 4931897 (1990-06-01), Tsukamoto et al.
patent: 5429972 (1995-07-01), Anjum et al.
patent: 5953254 (1999-09-01), Pourkeramati
patent: 6228740 (2001-05-01), Niroomand et al.
patent: 6294442 (2001-09-01), Kamal

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