Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2008-03-11
2008-03-11
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S942000, C257S021000, C257S021000
Reexamination Certificate
active
07341893
ABSTRACT:
Provided is a thin film device and an associated method of making a thin film device. For example, a thin film transistor with nano-gaps in the gate electrode. The method involves providing a substrate. Upon the substrate are then provided a plurality of parallel spaced electrically conductive strips. A plurality of thin film device layers are then deposited upon the conductive strips. A 3D structure is provided upon the plurality of thin film device layers, the structure having a plurality of different heights. The 3D structure and the plurality of thin film device layers are then etched to define a thin film device, such as for example a thin film transistor that is disposed above at least a portion of the conductive strips.
REFERENCES:
patent: 6028333 (2000-02-01), Yamazaki et al.
patent: 6351841 (2002-02-01), Tickle
patent: 6476419 (2002-11-01), Yasuda
patent: 6593624 (2003-07-01), Walker
patent: 6808646 (2004-10-01), Jeans
patent: 7056834 (2006-06-01), Mei et al.
patent: 2004/0002216 (2004-01-01), Taussig et al.
patent: 2004/0217085 (2004-11-01), Jeans
Jeans Albert
Mei Ping
Taussig Carl
Hewlett--Packard Development Company, L.P.
Isaac Stanetta
Lebentritt Michael
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