Structural analysis method employing finite element method

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07730444

ABSTRACT:
A structural analysis method that saves analysis time without lowering the prediction accuracy is provided. The structural analysis method has dividing up the analysis target into a plurality of finite elements; defining a plurality of meshes that divide up the analysis target into units larger than the finite elements and calculating, for each mesh, the proportion of one material among the plurality of materials that occupy the finite element contained in the mesh; specifying a mesh in which the calculated proportion of the one material exceeds a predetermined threshold value and generating mesh data by substituting material information specifying materials other than the one material with material information of the materials of the finite elements contained in the specified mesh; and calculating the physical amount yielded in the analysis target on the basis of the generated mesh data.

REFERENCES:
patent: 2003/0196181 (2003-10-01), Sano et al.
patent: 2004/0210425 (2004-10-01), Aoki et al.
patent: 2005/0008319 (2005-01-01), Cameron
patent: 2005/0246669 (2005-11-01), Yamazaki
patent: 09-218032 (1997-08-01), None
patent: 10-093206 (1998-04-01), None
patent: 2000-231579 (2000-08-01), None
patent: 2004-013437 (2004-01-01), None

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