Strobe technique for test of digital signal timing

Details Strobe technique for test of digital signal timing Strobe technique for test of digital signal timing

2005-09-23

2010-12-21

Beausoliel, Robert (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S731000, C714S744000

Reexamination Certificate

active

07856578

ABSTRACT:
A test system timing method simulates the timing of a synchronous clock on the device under test. Strobe pulses can be generated by routing an edge generator to delay elements with incrementally increasing delay values. A data signal or synchronous clock signal can be applied to the input of each of a set of latches which are clocked by the strobe pulses. An encoder can convert the series of samples which are thereby latched to a word representing edge time and polarity of the sampled signal. If the sampled signal is a data signal, the word can be stored in memory. If the sampled signal is a clock signal, the word is routed to a clock bus and used to address the memory. The difference between clock edge time and data edge time is provided and can be compared against expected values.

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