Stress detection circuit and semiconductor chip including same

Details Stress detection circuit and semiconductor chip including same Stress detection circuit and semiconductor chip including same

2008-05-28

2011-10-25

Caputo, Lisa (Department: 2855)

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

Specified electrical sensor or system

Reexamination Certificate

active

08042404

ABSTRACT:
A stress detection circuit includes a function block and a detection signal generation circuit. The function block outputs a first voltage such that the first voltage is varied depending on an extent that the function block is stressed. The detection signal generation circuit generates a stress detection signal based on the first voltage and a second voltage during a test mode. The stress detection signal represents integration of the function block, and a level of the second voltage corresponds to a level of the first voltage before the function block is stressed.

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