Stress and strain measuring apparatus and method

Details Stress and strain measuring apparatus and method Stress and strain measuring apparatus and method

1985-05-20

1987-05-26

Willis, Davis L.

Optics: measuring and testing

Material strain analysis

With polarized light

356327, G01B 1118

Patent

active

046680861

ABSTRACT:
Relative retardation resulting from passage of polarized white light through a stressed transparent material is measured automatically, by dividing the emerging polychromatic light into plurality of component beams, each containing one wavelength (or color) only, transforming the light intensity carried by each component beam into an electrical signal, and using these electrical signals to measure the relative retardation, proportional to the stress in the transparent material.
Means are provided to compare the spectral distribution of the light intensity measured at several wavelengths to the calculated distribution using an assumed value of retardation. Iterative (repetitious) calculations are performed until the measured distribution and calculated, using assumed retardation, agree. The retardation yielding agreement with the measured distribution is the measured retardation reflecting the stress in the material.

REFERENCES:
patent: 3443090 (1969-05-01), Sundstrom
patent: 3481671 (1969-12-01), West et al.
Redner, "New Automatic Polariscope System", Exptl. Mech., vol. 14, No. 12, pp. 486-491, 12/74.

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